---
# System prepended metadata

title: Yield Improvement

---

# Yield Improvement

Einnosys offers various solutions for Yield Improvement, ranging from simple barcode scanning of the lot boxes to very complex analysis of yield related issues by correlating end-to-end wafer data. Our team members have decades of experience in improving yield at all areas of Assembly, Test, Packaging factories and FABs.

In addition to implementing complex [**yield improvement**](https://www.einnosys.com/yield-improvement/) projects, our staff has published technical papers on how to use innovative, out-of-the-box automation to improve yield in factories.

Yield Management Solutions

* Host applications or station controllers that download and/or select recipes upon barcode or RFID scanning of lot boxes and remotely starting process
* Collection and analysis of alarms, events and other critical process parameters from equipment through [**SECS/GEM**](https://www.einnosys.com/introduction-secs-gem/) or other means and correlating with other data such as that from MES or from other equipment
* For Wafer FABs, correlating end-to-end wafer data: From epitaxial -> inline process <-> inline metrology <-> electrical testing <->Final Test
* Use feedback and feed-forward approach to feed metrology data to process equipment to improve yield

**Case Studies**

* At one wafer fab, our Yield Management solution resulted in improving yield by 0.8%
* At another wafer fab, our Yield Management system resulted in yield improvement of 0.6%

